回收横河AQ6376收购Yokogawa AQ6376光谱仪
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MWIR WELENGTH with internal gas purge and cut filter
The AQ6376 is the latest version of our bench- optical spectrum yzer extending the welength coverage well beyond the NIR range of our previous models into the MWIR region from 1500 to 3400 nm.
Popular applications include the detection of gases such as carbon oxides (COx), nitrogen oxides (x), and hydrocarbon gas (CxHy) for environmental studies.
Similar to the long welength model, it offers the added benefits of gas purging input ports / output ports, a built-in cut filter for high order diffracted light, and a vel double speed mode which increases the sweep speed up to 2 times compared to the standard sweep mode.
Key feature summary
Long welength range: 1500 to 3400 nm
Gas purging ports to reduce water vapor effects
Built-In cut filter for high order diffracted light
Double Speed Mode to further enhance fast measurement speed
High sensitivity down to -65 dBm
High resolution to 0.10 nm
Wide close-in dynamic range (55dB)
Fast auto-calibration
Free space optical input for maximum flexibility, low maintenance, and high reliability
Applicable to single-mode and multimode fibers
Excellent performance for environmental gas sensing Laser Spectroscopy
Indispensable tool for R&D and manufacturing of optical devices in the welength range from telecom band to 3.4μm
New Features
Purge feature
Due to the high resolution and sensitivity of the AQ6376, it can actually detect the presence of water molecules in the air. The water vapor is detected in the upper Near-IR welength region and could overlap with or mask the spectral characteristics of the actual device under test in that particular region.
By continuously supplying a pure purge gas such as nitrogen to the mochromator through the ports on the back panel, the AQ6376 can reduce the influence of water vapor absorptions and provide more reliable and accurate measurements than ever before.
Built-in cut filter for high order diffracted light
Due to the diffractive techlogy used, the mochromator in some circumstances could generate high order diffracted light, which appears at welengths equal to the integral multiple of input welengths.
By cutting incoming light below 1500 nm with the built-in filter, the AQ6376 drastically reduces the influence of high order diffracted light on the measurement. Thus, the measured data are always reliable and replicate the real signal under test.
Double speed mode
Increases the sweep speed up to 2 times compared to the standard sweep mode, with only a 2 dB penalty to the standard sensitivity value.
Long Welength Range: from 1500nm to 3400nm
The AQ6376 covers t only the welength span used in communications, but also the 3μm region which is used for environmental sensing, medical, biology and industrial applications.
High Sensitivity: down to -65dBm
The AQ6376 can measure optical power from +13dBm down to -65dBm thanks to its high-dynamic and very low ise components and circuits used for photo detection. This enables precise measurements of both high power and low power sources.
Measurement sensitivity can be chosen among 7 values according to the measurement speed required by the specific test to be performed.
The spectrum of a white light source (yellow) and the background ise of AQ6376 (purple)
High Resolution & Wide Dynamic Range
The AQ6376 uses a double-p mochromator structure to achieve high welength resolution (0.10 nm) and wide close-in dynamic range (55 dB). Thus, closely allocated signals and ise can be separately measured.
Measured 1550 nm laser, Close-in Dynamic range: @ peak±2 nm
High speed Measurement
GREATER EFFICIENCY
High Speed Sweep
With a proprietary sweep technique the AQ6376 achieves a much faster sweep speed than conventional measurement systems, which use a mochromator. Max. sweep time is only 0.5 sec. for 100 nm span.
Fast command processing and data transfer
Applying a fast microprocessor, the AQ6376 achieves very fast command processing speed and Ethernet interface provides up to 100 times faster data transfer speed than GP-IB.
Fast auto-calibration
The AQ6376 has a built-in reference light source for welength calibration and optical alignment of the mochromator components, allowing it to deliver always-accurate measurements.
The calibration and alignment process takes less on the unit take than 2 minutes and is fully automatic. TE: The welength calibration can also be performed by using an external reference source.
Free-Space Optical Input
The AQ6376 uses a free-space optical input structure, i.e. fiber is mounted inside the instrument.
This art solution is:
WORRY-FREE, as internal fiber can be scratched or get dirty
MAINTENANCE-FREE, as internal fiber has to be cleaned
VERSATILE, as the instrument accepts both /PC and /APC connectors
DUAL PURPOSE, as the instrument accepts both Single-Mode and Multi-Mode fibers without being affected by the high insertion loss from MM- fibers matching
