- 加工定制:是
- 检测类型:测试仪
- 检测范围:10-5次方
- 检测精度:3%
- 电源电压:220v
- 重量:8
- 包装方式:纸箱
提供FT-342导电膜电阻率测试仪
导电膜电阻率测试仪适用于生产企业、高等院校、科研部门,是检验和分析半导体材料质量的工具;液晶显示,自动测量和系数补偿,并带有温度补偿功能,自动转换量程;采用AD芯片控制,恒流输出,选配:PC软件,保存和打印数据,生成报表
用于:覆盖膜;导电高分子膜,高、低温电热膜;隔热、导电窗膜 导电(屏蔽)布、装饰膜、装饰纸;金属化标签、合金类箔膜;熔炼、烧结、溅射、涂覆、涂布层,电阻式、电容式触屏薄膜;电极涂料,其他半导体材料、薄膜材料方阻测试等相关产品
提供FT-342导电膜电阻率测试仪
规格型model | FT-331 | FT-332 | FT-333 | FT-334 | FT-335 | FT-336 |
1.方块电阻范围Sheet resistance | 10-5~2×105Ω/□ | 10-4~2×105Ω/□ | 10-3~2×105Ω/□ | 10-3~2×104Ω/□ | 10-2~2×105Ω/□ | 10-2~2×104Ω/□ |
2.电阻率范围Resistivity | 10-6~2×106Ω-cm | 10-5~2×106Ω-cm | 10-4~2×106Ω-cm | 10-4~2×105Ω-cm | 10-3~2×106Ω-cm | 10-3~2×105Ω-cm |
测试电流范围 Test current | 0.1μA ,1μA,10μA,100μA,1mA,10mA,100mA | 10μA,100μA,1mA,10mA,100mA | 0.1μA ,1μA,10μA,100μA,1mA,10mA,100mA | 10μA,100μA,1mA,10mA, 100mA | 0.1μA,1μA,10μA,100μA,1mA,10mA,100mA | 1μA,10μA,100μA,1mA,10mA,100mA |
4.电流 Current accura | ±0.1% | ±0.2% | ±0.2% | ±0.3% | ±0.3% | ±0.3% |
5.电阻Resistance | ≤0.3% | ≤0.3% | ≤0.3% | ≤0.5% | ≤0.5% | ≤0.5% |
6.显示读数display | 液晶显示:电阻、电阻率、方阻、温度、单位换算、温度系数、电流、电压、探针形状、探针间距、厚度 、电导率LCD: resistance. resistivity. sheet resistance. temperature. unit conversion.temperature coefficient. current. voltage. probe shape. probe spacing. thickness. conductivity | |||||
7.测试方式test mode | 普通单电测量general single electrical measurement | |||||
8.工作电源power | 输入: AC 220V±10%.50Hz 功 耗:<30W | |||||
9.误差errors | ≤4%(标准样片结果 Standard Sample results) | |||||
10.选购功能choose to buy | 选购1.pc软件; 选购2.方形探头; 选购3.直线形探头; 选购4.测试平台;5.标准电阻 1.pc software; 2. square probe; 3. linear probe; 4. test Platform. | |||||
11.测试探头Test probe | 探针间距选购:1mm;2mm;3mm三种规格; 探针材质选购:碳化钨针;白钢针;镀金磷铜半球形针Optional probe spacing: 1mm;2mm;3mm in three sizes. Select probe material: tungsten carbide needle. white steel needle. gilded copper hemispherical needles. |
提供FT-342导电膜电阻率测试仪
硅片电阻率测量的标准(ASTM F84)及国家标准设计制造;GB/T 1551-2009 《硅单晶电阻率测定方法》、GB/T 1552-1995《硅、锗单晶电阻率测定直流四探针法》.
提供FT-342导电膜电阻率测试仪