美国GGB原装进口40A高频/微波/射频探针

深圳市森东宝代理美国GGB全系列探针

以下是射频探针 model 40A系列

购买须知：

     1、此款产品起拍量为一个

     2、购买前请一定要咨询客服，询问是否有足够的库存，直接拍下付款者概不发货

     3、可开发票，详情请咨询客服

40A射频探头 ?测试频率直流到40GHZ ?输入衰减小于0.8db ?反射损耗大于18 db ?脚间距可以从50到2540微米 ?测试重复性优于-80db

Model 40A-configuration - pitch - mounting style

Configuration: Specify GSG, GS or SG for tip placement where S is the signal tip and G is a ground tip. Use the following diagram to determine the appropriate configuration.  Pitch: Specify ground (G) to signal (S) tip spacing in Microns from 50 to 1250 microns. For standard GSG probes, the two spacings are equal. Contact the factory for spacings larger than 1250 microns or unusual tip placement and spacings.

Mounting Style: Choose from thirteen adapter styles. Specify T, C, GR, P, DP, EDP, LP, Q, F, S, DS, VP, or RVP. Choose the appropriate mounting type for your application. The P, DP, EDP, LP, Q, S, DS, VP, and RVP styles have the connector pointing back at a 45 degree angle to give more working area above the probe. The DP, EDP, DS, VP, and RVP styles are used where extra clearance beneath the probe is needed. When using DP, EDP, and DS style probes, probe positioning is more difficult due to the increased probing angle since the probe points slide further forward for a given change in the Z axis than our other style probes. Custom mounting styles are available 

Example:A 40A-GSG-150-P is a Model 40A with Ground, Signal, Ground configuration with 150 microns between each contact mounted in a P style adaptor.