Polytec白光检测仪

Polytec’s Map Metro.Lab is an affordable, high-precision, non-contact ography
measurement system designed to characterize flat and curved surfaces. Incorporating a
scanning white-light interferometer, the Metro.Lab can measure flatness and general
ography with 20 nanometer resolution and determine parallelity of two or more
surfaces separated by as much as 70 mm.
The Map Metro.Lab is a complete
measurement station for characterizing the
ography of large surfaces without contact.
Complex parts can have many precision flat
and curved surfaces that must be measured
and compared. The Metro.Lab’s wide field-ofview
and large z-dynamic range are critical
advantages when fast throughput is desired.
By combining increased throughput, simple
operation, precision measurement and an
affordable cost, Polytec is changing traditional
contact metrology.
With a large z-dynamic range of 70 mm, the
measurement of flatness, ripple and paralleli
is simple even under traditionally difficult
circumstances such as comparing the and
bottom surfaces of a blind hole. Clic surface
parameters currently measured with touch
probes can also easily be investigated with the
Metro.Lab.
Since the complete measurement area is
captured in one measurement run instead of
composing it from individual lines, measurements
are often completed in just a few seconds.
Features
- Non-contact ography measuring
interferometer
- Measurement on surfaces near steep
edges (e.g. drilling holes) is possible
due to telecentric optics
- Increased flexibility due to large 70 mm
z-dynamic range
- Fast measurement over large field-of-view
- Large 80 mm x 80 mm field-of-view
possible with simplified stitching
(enhanced version)