- 类型:测试仪
- 测量范围:固体
- 测量精度:3%
- 分辨率:3%
- 电源:220v
- 稳定性:3%
- 温度补偿:2
- 显示:显示屏
FT-330系列普通四探针方阻电阻率测试仪
二.参照标准standard:
硅片电阻率测量的标准(ASTM F84)及国家标准设计制造;GB/T 1551-2009 《硅单晶电阻率测定方法》、GB/T 1552-1995《硅、锗单晶电阻率测定直流四探针法》.
FT-330系列普通四探针方阻电阻率测试仪
三.适用范围Applicable scope:
适用于生产企业、高等院校、科研部门,是检验和分析半导体材料质量的工具;液晶显示,自动测量和系数补偿,并带有温度补偿功能,自动转换量程;采用AD芯片控制,恒流输出,选配:PC软件,保存和打印数据,生成报表
用于:覆盖膜;导电高分子膜,高、低温电热膜;隔热、导电窗膜 导电(屏蔽)布、装饰膜、装饰纸;金属化标签、合金类箔膜;熔炼、烧结、溅射、涂覆、涂布层,电阻式、电容式触屏薄膜;电极涂料,其他半导体材料、薄膜材料方阻测试等相关产品
FT-330系列普通四探针方阻电阻率测试仪
四.型号及参数Models and technical parameters
规格型model | FT-331 | FT-332 | FT-333 | FT-334 | FT-335 | FT-336 |
1.方块电阻范围Sheet resistance | 10-5~2×105Ω/□ | 10-4~2×105Ω/□ | 10-3~2×105Ω/□ | 10-3~2×104Ω/□ | 10-2~2×105Ω/□ | 10-2~2×104Ω/□ |
2.电阻率范围Resistivity | 10-6~2×106Ω-cm | 10-5~2×106Ω-cm | 10-4~2×106Ω-cm | 10-4~2×105Ω-cm | 10-3~2×106Ω-cm | 10-3~2×105Ω-cm |
测试电流范围 Test current | 0.1μA ,1μA,10μA,100μA,1mA,10mA,100mA | 10μA,100μA,1mA,10mA,100mA | 0.1μA ,1μA,10μA,100μA,1mA,10mA,100mA | 10μA,100μA,1mA,10mA, 100mA | 0.1μA,1μA,10μA,100μA,1mA,10mA,100mA | 1μA,10μA,100μA,1mA,10mA,100mA |
4.电流 Current accura | ±0.1% | ±0.2% | ±0.2% | ±0.3% | ±0.3% | ±0.3% |
5.电阻Resistance | ≤0.3% | ≤0.3% | ≤0.3% | ≤0.5% | ≤0.5% | ≤0.5% |
6.显示读数display | 液晶显示:电阻、电阻率、方阻、温度、单位换算、温度系数、电流、电压、探针形状、探针间距、厚度 、电导率LCD: resistance. resistivity. sheet resistance. temperature. unit conversion.temperature coefficient. current. voltage. probe shape. probe spacing. thickness. conductivity | |||||
7.测试方式test mode | 普通单电测量general single electrical measurement | |||||
8.工作电源power | 输入: AC 220V±10%.50Hz 功 耗:<30W | |||||
9.误差errors | ≤4%(标准样片结果 Standard Sample results) | |||||
10.选购功能choose to buy | 选购1.pc软件; 选购2.方形探头; 选购3.直线形探头; 选购4.测试平台;5.标准电阻 1.pc software; 2. square probe; 3. linear probe; 4. test Platform. | |||||
11.测试探头Test probe | 探针间距选购:1mm;2mm;3mm三种规格; 探针材质选购:碳化钨针;白钢针;镀金磷铜半球形针Optional probe spacing: 1mm;2mm;3mm in three sizes. Select probe material: tungsten carbide needle. white steel needle. gilded copper hemispherical needles. |
FT-330系列普通四探针方阻电阻率测试仪